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 Philips Semiconductors
Product specification
TrenchMOSTM transistor Logic level FET
FEATURES
* 'Trench' technology * Very low on-state resistance * Fast switching * Stable off-state characteristics * High thermal cycling performance * Surface mounting package
PHT6N03LT
SYMBOL
d
QUICK REFERENCE DATA VDSS = 30 V ID = 5.9 A
g s
RDS(ON) 30 m (VGS = 5 V) RDS(ON) 28 m (VGS = 10 V) SOT223
DESCRIPTION
GENERAL DESCRIPTION
N-channel enhancement mode logic level field-effect power transistor using 'trench' technology. The device has very low on-state resistance. It is intended for use in dc to dc converters and general purpose switching applications. The PHT6N03LT is supplied in the SOT223 surface mounting package.
PINNING
PIN 1 2 3 tab gate drain source drain
4
1
2
3
LIMITING VALUES
Limiting values in accordance with the Absolute Maximum System (IEC 134) SYMBOL PARAMETER VDSS VDGR VGS ID IDM PD Tj, Tstg Drain-source voltage Drain-gate voltage Gate-source voltage Continuous drain current Pulsed drain current Total power dissipation Operating junction and storage temperature CONDITIONS Tj = 25 C to 150C Tj = 25 C to 150C; RGS = 20 k Tamb = 25 C; VGS = 10 V Tamb = 100 C; VGS = 10 V Tamb = 25 C MIN. - 55 MAX. 30 30 13 5.9 4.1 23.6 1.8 150 UNIT V V V A A A W C
ESD LIMITING VALUE
SYMBOL PARAMETER VC Electrostatic discharge capacitor voltage, all pins CONDITIONS Human body model (100 pF, 1.5 k) MIN. MAX. 2 UNIT kV
THERMAL RESISTANCES
SYMBOL PARAMETER Rth j-sp Rth j-a Thermal resistance junction to solder point Thermal resistance junction to ambient CONDITIONS mounted on any pcb mounted on test pcb of fig:17 MIN. TYP. MAX. UNIT 70 15 K/W K/W
January 1998
1
Rev 1.300
Philips Semiconductors
Product specification
TrenchMOSTM transistor Logic level FET
ELECTRICAL CHARACTERISTICS
Tj= 25C unless otherwise specified SYMBOL PARAMETER V(BR)DSS V(BR)GSS VGS(TO) RDS(ON) gfs IDSS IGSS Qg(tot) Qgs Qgd td on tr td off tf Ld Ld Ls Ciss Coss Crss Drain-source breakdown voltage Gate-source breakdown voltage Gate threshold voltage Drain-source on-state resistance CONDITIONS VGS = 0 V; ID = 0.25 mA; Tj = -55C IG = 1 mA VDS = VGS; ID = 1 mA Tj = 150C Tj = -55C VGS = 5 V; ID = 3.2 A VGS = 10 V; ID = 3.2 A VGS = 5 V; ID = 3.2 A; Tj = 150C Forward transconductance VDS = 25 V; ID = 5.9 A Zero gate voltage drain VDS = 30 V; VGS = 0 V; current Tj = 150C Gate source leakage current VGS = 5 V; VDS = 0 V Tj = 150C Total gate charge Gate-source charge Gate-drain (Miller) charge Turn-on delay time Turn-on rise time Turn-off delay time Turn-off fall time Internal drain inductance Internal drain inductance Internal source inductance Input capacitance Output capacitance Feedback capacitance ID = 5.9 A; VDD = 24 V; VGS = 5 V MIN. 30 27 10 1 0.6 8 -
PHT6N03LT
TYP. MAX. UNIT 1.5 24 18 14 0.05 0.02 24 3 11 30 80 95 40 3.5 3.5 7.5 1050 270 140 2 2.3 30 28 51 10 500 1 10 45 130 135 55 V V V V V V m m m S A A A A nC nC nC ns ns ns ns nH nH nH pF pF pF
VDD = 15 V; ID = 5.9 A; VGS = 5 V; RG = 5 Resistive load Measured from tab to centre of die Measured from drain lead to centre of die Measured from source lead to source bond pad VGS = 0 V; VDS = 25 V; f = 1 MHz
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS
Tj = 25C unless otherwise specified SYMBOL PARAMETER IS ISM VSD trr Qrr Continuous source current (body diode) Pulsed source current (body diode) Diode forward voltage Reverse recovery time Reverse recovery charge CONDITIONS MIN. IF = 5.9 A; VGS = 0 V IF = 5.9 A; -dIF/dt = 100 A/s; VGS = -10 V; VR = 25 V TYP. MAX. UNIT 0.75 100 0.4 5.9 10 1.2 A A V ns C
January 1998
2
Rev 1.300
Philips Semiconductors
Product specification
TrenchMOSTM transistor Logic level FET
AVALANCHE LIMITING VALUE
SYMBOL PARAMETER WDSS Drain-source non-repetitive unclamped inductive turn-off energy CONDITIONS ID = 5.9 A; VDD 15 V; VGS = 10 V; RGS = 50 ; Tamb = 25 C MIN. -
PHT6N03LT
MAX. 60
UNIT mJ
120 110 100 90 80 70 60 50 40 30 20 10 0
PD%
Normalised Power Derating
100
ID / A
DS / ID
7830-30
10
RD
S(
) ON
=V
tp = 10 us 100 us
1 DC
1 ms 10 ms
0.1
100 ms
0
20
40
60 80 100 Tamb / C
120
140
0.01 0.1
1
10 VDS / V
100
1000
Fig.1. Normalised power dissipation. PD% = 100PD/PD 25 C = f(Tamb)
Fig.3. Safe operating area. Tamb = 25 C ID & IDM = f(VDS); IDM single pulse; parameter tp
Zth j-amb / (K/W) BUKX83
120 110 100 90 80 70 60 50 40 30 20 10 0
ID%
Normalised Current Derating
1E+02
D= 0.5
0.2 0.1 0.05 0.02
P D tp D= tp T
1E+01
1E+00
1E-01 0
0 20 40 60 80 100 Ambient temperature, Tamb (C) 120 140
T t
1E-02 1E-07
1E-05
1E-03 t/s
1E-01
1E+01
1E+03
Fig.2. Normalised continuous drain current. ID% = 100ID/ID 25 C = f(Tamb); conditions: VGS 5 V
Fig.4. Transient thermal impedance. Zth j-amb = f(t); parameter D = tp/T
January 1998
3
Rev 1.300
Philips Semiconductors
Product specification
TrenchMOSTM transistor Logic level FET
PHT6N03LT
60 50 40
ID / A 10 6
BUK9830-30 5 4.5
20
gfs / S
9830-30
4 VGS / V = 30 20 10 0 3.5
10
Tj / C = 25 150
3 2.5 0 2 4 VDS / V 6 8 10
0 0 10 20 30 ID / A 40 50 60
Fig.5. Typical output characteristics, Tj = 25 C. ID = f(VDS); parameter VGS
RDS(ON) / mOhm 3 3.5 9830-30 4
Fig.8. Typical transconductance, Tj = 25 C. gfs = f(ID); conditions: VDS = 25 V
a
60 50
2
SOT223 30V Trench
Normalised RDS(ON) = f(Tj)
1.5
40 30 20 10 0 VGS / V = 4.5 5 10 6
1
0.5
0
10
20
30 ID / A
40
50
60
0 -50
0
50 Tj / C
100
150
Fig.6. Typical on-state resistance, Tj = 25 C. RDS(ON) = f(ID); parameter VGS
ID / A
Fig.9. Normalised drain-source on-state resistance. a = RDS(ON)/RDS(ON)25 C = f(Tj); ID = 3.2 A; VGS = 5 V
VGS(TO) / V max. BUK959-60
60 50 40 30 20 10 0
9830-30
2.5
2
Tj / C = 25
1.5
typ.
150
min. 1
0.5
0
1
2
3 VGS / V
4
5
6
0 -100
-50
0
50 Tj / C
100
150
200
Fig.7. Typical transfer characteristics. ID = f(VGS) ; conditions: VDS = 25 V; parameter Tj
Fig.10. Gate threshold voltage. VGS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS
January 1998
4
Rev 1.300
Philips Semiconductors
Product specification
TrenchMOSTM transistor Logic level FET
PHT6N03LT
1E-01
Sub-Threshold Conduction
60 50
IF / A
9830-30
1E-02
40
1E-03 2% typ 98%
30 Tj / C = 150
1E-04
25
20 10 0
1E-05
1E-05
0
0.5
0
0.5
1
1.5
2
2.5
3
1 VSDS / V
1.5
2
Fig.11. Sub-threshold drain current. ID = f(VGS); conditions: Tj = 25 C; VDS = VGS
C / pF
Fig.14. Typical reverse diode current. IF = f(VSDS); conditions: VGS = 0 V; parameter Tj
WDSS%
10000
9528-30
120 110 100 90 80 70 60 50 40
Ciss 1000
Coss Crss 100 0.1
30 20 10 0 20 40 60 80 100 120 140
Ambient temperature, Tamb (C)
1 VDS / V
10
100
Fig.12. Typical capacitances, Ciss, Coss, Crss. C = f(VDS); conditions: VGS = 0 V; f = 1 MHz
VGS / V 5 VDS / V = 6
Fig.15. Normalised avalanche energy rating. WDSS% = f(Tamb); conditions: ID = 5.9 A
9830-30 24
+
L VDS
VDD
4
3
VGS
2
-ID/100 T.U.T. R 01 shunt
0 RGS
0 5 10 QG / nC 15 20 25
1
0
Fig.13. Typical turn-on gate-charge characteristics. VGS = f(QG); conditions: ID = 5.9 A; parameter VDS
Fig.16. Avalanche energy test circuit. 2 WDSS = 0.5 LID BVDSS /(BVDSS - VDD )
January 1998
5
Rev 1.300
Philips Semiconductors
Product specification
TrenchMOSTM transistor Logic level FET
PRINTED CIRCUIT BOARD
PHT6N03LT
Dimensions in mm.
36
18
60 9 4.6 4.5
10
7 15 50
Fig.17. PCB for thermal resistance and power rating for SOT223. PCB: FR4 epoxy glass (1.6 mm thick), copper laminate (35 m thick).
January 1998
6
Rev 1.300


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